About the Biometric Consortium
Supported by the National Institute of Standards and Technology (NIST) and the National Security Agency (NSA), the
Biometrics Consortium is focused on Biometric Technologies for Defense, Homeland Security, Identity
Management, Border Crossing and Electronic Commerce.
The Biometric Consortium serves as a focal point for research, development, testing, evaluation, and application of
biometric-based personal identification/verification technology. The Biometric Consortium organizes a premier
biometrics conference every fall (advertised below). Information about past conferences, current government and
standards activity, and other biometric resources can be found throughout this web site.
The Biometric Consortium is co-chaired by Jeffrey S. Dunn/NSA and
Fernando Podio/NIST, Vince Patton/Vice President, Homeland Security Programs, AFCEA International, and Duane Blackburn/MITRE.
Please mark your calendar for the 2013 Biometric Consortium Conference & Biometric Technology Expo September 17 - 19, 2013 in the Tampa Convention Center, Tampa, FL USA.
Quick Facts:
What are the conference dates?
17-19 September 2013
Where is the conference location?
Tampa Convention Center
333 South Franklin Street
Tampa, FL 33602
What is the objective of the conference?
Since 1992, the Biometric Consortium Conference has served as a focal point for research, development, testing, evaluation, and application of biometric-based identification and verification technology. In recent years, the Conference has expanded to include a broad range of identity technology issues. The Conference provides a unique forum to bring together government, industry, and academia.
The two and one-half day Biometric Consortium Conference & Technology Expo is the largest and longest running biometrics/identity management conference in the US with over 1,700 attendees representing 60 US Government organizations, 30 state and local organizations and 26 academic organizations. Attendees from over 30 countries are expected. The Conference provides over 60 hours of instructional time from over 100 speakers and over 50 hours of special meeting and workshop opportunities.
These sessions are complimented by the co-located Biometric Technology Expo. This includes over 80 exhibitors covering over 15,000 sq. ft. of exhibit area to showcase the latest biometric and identification technologies such as fingerprint, face, iris, and speaker recognition; rapid DNA analysis; hand-held, portable, and enterprise solutions.
Online Housing Reservations is open NOW - Click Here!.
2013 Conference Registration Rates (USD) - Online Conference Registration will open 13 June 2013
Government/Non-Profit - $595
Industry/Consultant - $695
Student - $295
Exhibitor Full Conference Over Allotment - $695
Opening Reception Additional Ticket - $50
Exhibit Hall Only - Free
Join nearly 2,000 participants, including (2012 numbers):
100+ speakers
100+ federal, state & local government organizations
39 US states
30 countries
30+ academic institutions
475+ biometric industry, system integrators and user organizations
Biometric Consortium Conference Schedule:
Note: Monday, 16 September, 1:00 pm to 3:30 pm
Special Biometrics Tutorial presented by Dr. James Wayman, San Jose State University
Tuesday 17 September 2013 - 8:15 am to 5:00 pm
Wednesday 18 September 2013 - 8:25 am to 5:00 pm
Thursday 19 September 2013 - 8:30 am to 12:00 noon
Keynote Speaker Tuesday 17 September 2013, 1:30 pm - Colonel Bernard Wulfse, Commander, Dutch Army, Joint Task Force Counter IED - NATO's Multinational Project. Biometrics in Support of NATO Operationsp>
Keynote Speaker Wednesday 18 September 2013, 1:30 pm - Mr. Jeremy Grant, Senior Executive Advisor for Identity Management, National Strategy for Trusted Identities in Cyberspace (NSTIC), National Institute of Standards and Technology (NIST)
Keynote Speaker, Thursday 19 September 2013, 8:30 am - Mr. William Hoffman, World Economic Forum
Sessions include:
Tuesday 17 September 2013, 8:30 am -Opening Panel Discussing Current and Future Biometric and Identity Management Areas of Interest
- Dr. Arun Ross/Michigan State University, Key Technological Gains Over the Past Year
- Mr. John Boyd/DoD, Major Advancements in Government Applications Over the Past Year
- Mr. Walter Hamilton/IBIA, Major Private Sector Initiatives Over the Past Year
- Ms. Kelli Emerick/Secure ID Coalition, Policy/Poltical/Legislative Outlook for the Next Year
- Dr. Joseph Atick/Identity Council International, Future Industry Outlook
Two and one half day program:
Track A - A Biometric Perspective
Tuesday, 17 September 2013
- Department of Defense (DoD) - Moderator - Mr. John Boyd/DoD
- Private Sector - Moderators - Mr. Walter Hamilton/IBIA, Mr. John Christensen/Global Technical Systems
- Biometric Standards - Moderator - Mr. Fernando Podio/NIST
Wednesday, 18 September 2013
- Department of Homeland Security (DHS) - Moderator - Mr. Arun Vemury/DHS
- International - Moderators - Dr. Raul Sanchez-Reillo/Carlos III University of Madrid, Dr. Young-Bin Kwon/Chung-Ang University, Dr. Christoph Busch, Fraunhofer Institute for Computer Graphics
- National Institute of Standards and Technology (NIST) - Moderator - Mr. Michael Garris/NIST
- Academic Research - Moderator - Dr. Bojan Cukic/West Virginia University
- Interagency - Moderator - Mr. Duane Blackburn/MITRE
Thursday, 19 September 2013
- Department of Justice (DOJ)/Federal Bureau of Investigation (FBI) - Moderator - Mr. James Loudermilk/FBI
- Private Sector - Moderators - Mr. Walter Hamilton/IBIA, Mr. John Christensen/Global Technical Systems
Track B - Policy, Planning & Integration
Tuesday, 17 September 2013
- Private Sector - Moderators - Mr. Walter Hamilton/IBIA, Mr. John Christensen/Global Technical Systems
- Department of Defense (DoD) - Moderator - Mr. John Boyd/DoD
Wednesday, 18 September 2013
- International - Moderators - Dr. Raul Sanchez-Reillo/Carlos III University of Madrid, Dr. Young-Bin Kwon/Chung-Ang University, Dr. Christoph Busch, Fraunhofer Institute for Computer Graphics
- Department of Homeland Security (DHS) - Moderator - Mr. Arun Vemury/DHS
- National Institute of Standards and Technology (NIST) - Moderator - Mr. Michael Garris/NIST
Thursday, 19 September 2013
- Department of Justice (DOJ)/Federal Bureau of Investigation (FBI) - Moderator - Mr. James Loudermilk/FBI
Track C - Technology Focus
Tuesday, 17 September 2013
- IEEE Biometrics, Identity & Security (BIdS) Research Showcase - Moderators - Dr. Stephanie Schuckers/Clarkson University, Dr. Bojan Cukic/West Virginia University
- Iris Technology - Moderator - Dr. James Matey/NIST
Wednesday, 18 September 2013
- Rapid DNA - Moderator - Dr. Thomas Callaghan/FBI
- Biometric Standards - Moderator - Mr. Fernando Podio/NIST
Thursday, 19 September 2013
- Face Technology - Moderator - Dr. Richard Vorder Bruegge/FBI
Track D - AFCEA Identity Management (IdM)
- Tuesday, 17 September 2013
- Wednesday, 18 September 2013
- Thursday, 19 September 2013
Track E - Focused Workshops & Special Sessions
Tuesday, 17 September 2013
- Biometric Quality Workshop - Ms. Elham Tabassi/NIST, Dr. Christoph Busch, Fraunhofer Institute for Computer Graphics
- Scientific Working Group (SWG) on Speaker Recognition - Moderator - Dr. Hirotaka Nakasone/FBI
Wednesday, 18 September 2013
- Iris Technology - Moderator - Dr. James Matey/NIST
- IEEE Certified Biometric Professional (CBP) Workshop - Mr. Richard Ringold/Holmes Corporation
- Rapid DNA - Moderator - Dr. Thomas Callaghan/FBI
Thursday, 19 September 2013
- Special Sessions
Biometric Technology Expo:
Tuesday 17 September 2013 - 12:00 noon to 5:00 pm
Wednesday 18 September 2013 - 10:00 am to 4:00 pm
Thursday 19 September 2013 - 8:30 am to 12:00 noon
60,000 sq. ft. exhibit hall
80+ national and international technology exhibitors/demonstrations
wide range of hardware and software solutions to biometric and identity management challenges, including:
fingerprint recognition
face recognition
iris recognition
speaker recognition
rapid DNA
novel biometrics
Click here for additional information about the conference or to sign up to be an exhibitor in the 2013 Biometric Consortium Technology Expo.
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